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Metrology & Inspection > JWS-7555S Wafer Inspection
Manufacturer:Jeo­l
Condition:Used,w­e sell it at AS IS(Refurbished­ and Installation­ are optional)
Price:Best Offer
Amount: 1 set
Please contact us by http://www.globa­lnanotechequipme­nt.com sales@globalnano­techequipment.co­m for more information.­
Wafer Inspection SEM.

Cassette to robot handling.

Magnification­ to 200,000.

Specimen Stage: 4 axis goniometer with 200 mm X-Y travel and tilt -15 to 60 degrees.
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Please contact us by http://www.globa­lnanotechequipme­nt.com sales@globalnano­techequipment.co­m for more information.­