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Metrology & Inspection > KLA-Tencor Surfscan 6200

Metrology & Inspection > KLA-Tencor Surfscan 6200
Metrology & Inspection > KLA-Tencor Surfscan 6200
Manufacturer:KLA­-Tencor
Condition:Used,w­e sell it at AS IS(Refurbished­ and Installation­ are optional)
Price:Best Offer
Amount: 3 sets
Please contact us by http://www.globa­lnanotechequipme­nt.com sales@globalnano­techequipment.co­m for more information.­
, Wafer Surface Analysis System/Particle­ Counter For Non-Patterned­ Wafers.
, Wafer size from 2" to 8" dia.
, Sensitivity - Particle: .117 micro-meter dia. latex spheres with > 90% capture rate.
, Haze: .1 ppm minimum.
, Cassette to cassette handling.
, Supplies enlarged 3D images, scan prints for quick analysis.
Inventory on sale:
Bunch Sell List
Backside Equipment
Deposition Equipment
Dry Asher Etch RIE ICP
Electronic Tester
Iron Implanter
Lithography & Photoresist
Metrology & Inspection
Rapid Thermal Process
Sputtering and Evaporator System
Wafer Probe
Wet Processing Equipment
Others
Metrology Equipment
Hitachi S-8840 CD-SEM
S-8820 CD-SEM
S-9300 CD-SEM
S-5000H
S-4700 FE-SEM
Hitachi S-4500 FE-SEM
S-4160 FE-SEM
S-2500ci SEM
S-2300 SEM
S-2150 SEM
S-800 SEM
S-570 SEM
LEO 982 FE-SEM
LEO 1550 FE-SEM
JEOL JSM 840
Micrion FIB M9500
Energy Dispersive X- Ray Spectrometer­ QUANTAX 200
XFlash 5010 Detector
High Quality Track Systems
Tractrix Spin Tool
Graphical User Interface
Features
Optional Features
Process Flows
SpinBall Spin Station
Cartridge Dispense System
Manual Bake Oven
Enhanced SVG System
EQUIPE / PRI robot repair and refurbish
ATM/EQUIPE robots
Robot Controllers
Wafer Prealigners
New Arrival
Main Quartz Ceramic SiC Si Parts
Main Quartz Ceramic SiC Si Parts in stock on sale
Please contact us by http://www.globa­lnanotechequipme­nt.com sales@globalnano­techequipment.co­m for more information.­
NameEmily (San Jose, California)   Send e-mail to EmilyE-mail    
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