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Industrial & Machinery.Wafer Probe > EG 1034
Wafer Probe > EG 1034
Manufacturer:ELECTROGLAS Condition:Fully Refurbished in 2 to 4 weeks by GNS Price:Contact Us Amount in stock: 20 sets. Please contact us by http://www.globalnanotechequipment.com sales@globalnanotechequipment.com for more information. The ELECTROGLAS Model 1034X Automatic Wafer Probe is a precision instrument for testing and classifying semiconductor devices in wafer form. The Model I034X is a self-nontained system comprising two modules, a probe module and a power module. Both modules are designed for compact bench-top mounting; however, an interconnecting cable permits remote mounting of the power module when desired. The ELECTROGLAS 1034X is designed for operational simplicity and fast wafer throughput. The unique ELECTROGLAS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position. Simplified manual and semi-automatic controls assure rapid wafer alignment by automatic gross positioning, simplified theta alignment, and precise device alignment by use of a multi-function joystick that provides 20 different manual commands in a single control. The high-speed automatic probing cycle provides automatic indexing, probing and inking of all devices on the wafer under preprogrammed indexing control, and automatic return to the load position when probing is complete. The system accommodates up to 4-inch (102-mm) wafers and provides indexing in either English or Metric system units. Original Electroglas EG1034X Wafer Prober key features£º • Direct computer control (if the SUPER D control module is used) • Wafer Size Range: 3¡å-- 6¡å • X-Y stage travel: 150mm¡Á150mm • Power supply: 110V/220V£¬50/60Hz • Compressed air pressure: 80 psi • Power consumption: <100W • Accuracy: ¡À5¦Ìm Inventory on sale: Bunch Sell List Backside Equipment Deposition Equipment Dry Asher Etch RIE ICP Electronic Tester Iron Implanter Lithography & Photoresist Metrology & Inspection Rapid Thermal Process Sputtering and Evaporator System Wafer Probe Wet Processing Equipment Others Metrology Equipment Hitachi S-8840 CD-SEM Hitachi S-8820 CD-SEM S-800 SEM Hitachi S-570 SEM LEO 982 FE-SEM LEO 1550 FE-SEM JEOL JSM 840 Micrion FIB M9500 Energy Dispersive X- Ray Spectrometer QUANTAX 200 XFlash 5010 Detector High Quality Track Systems Tractrix Spin Tool Graphical User Interface Features Optional Features Process Flows SpinBall Spin Station Cartridge Dispense System Manual Bake Oven Enhanced SVG System EQUIPE / PRI robot repair and refurbish ATM/EQUIPE robots Robot Controllers Wafer Prealigners New Arrival Main Quartz Ceramic SiC Si Parts Main Quartz Ceramic SiC Si Parts in stock on sale Please contact us by http://www.globalnanotechequipment.com sales@globalnanotechequipment.com for more information. Emily (San Jose, California) E-mail
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